"Using gated experts in fault diagnosis and prognosis."

Hamid R. Berenji et al. (2004)

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DOI: 10.1109/FUZZY.2004.1375773

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-16

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Hamid R. Berenji, Yan Wang, David Vengerov, Reza Langari, Mo M. Jamshidi:
Using gated experts in fault diagnosis and prognosis. FUZZ-IEEE 2004: 463-467

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