"On minimizing testing rounds for fault identification."

Edward F. Schmeichel et al. (1988)

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DOI: 10.1109/FTCS.1988.5330

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Edward F. Schmeichel, S. Louis Hakimi, M. Otsuka, Geoff Sullivan:
On minimizing testing rounds for fault identification. FTCS 1988: 266-271

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