"Design and analysis of test schemes for algorithm-based fault tolerance."

Dechang Gu, Daniel J. Rosenkrantz, S. S. Ravi (1990)

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DOI: 10.1109/FTCS.1990.89341

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Dechang Gu, Daniel J. Rosenkrantz, S. S. Ravi:
Design and analysis of test schemes for algorithm-based fault tolerance. FTCS 1990: 106-113

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