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"Row/column pattern sensitive fault detection in RAMs via built-in self-test."
Manoj Franklin, Kewal K. Saluja, Kozo Kinoshita (1989)
- Manoj Franklin, Kewal K. Saluja, Kozo Kinoshita:
Row/column pattern sensitive fault detection in RAMs via built-in self-test. FTCS 1989: 36-43
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