"A Linear Type System for L^p-Metric Sensitivity Analysis."

Victor Sannier, Patrick Baillot (2024)

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DOI: 10.4230/LIPICS.FSCD.2024.12

access: open

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Victor Sannier, Patrick Baillot:
A Linear Type System for L^p-Metric Sensitivity Analysis. FSCD 2024: 12:1-12:22

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