"A novel BIST approach for testing input/output buffers in FPGAs."

Lei Chen, Zhiquan Zhang, Zhiping Wen (2009)

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DOI: 10.1145/1508128.1508200

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-06

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Lei Chen, Zhiquan Zhang, Zhiping Wen:
A novel BIST approach for testing input/output buffers in FPGAs. FPGA 2009: 285

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