"Knowledge transfer: Does more experience yield improved design quality?"

DeLean Tolbert et al. (2016)

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DOI: 10.1109/FIE.2016.7757349

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/fie/TolbertLLSC16
DeLean Tolbert, Reis Lehman, Guannan Liu, Benjamin Sadler, Monica Cardella:
Knowledge transfer: Does more experience yield improved design quality? FIE 2016: 1-4

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