"Built-in Self-testing of Logic Circuits Using Imperfect Duplication."

R. Kh. Latypov (1987)

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DOI: 10.1007/3-540-18740-5_59

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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R. Kh. Latypov:
Built-in Self-testing of Logic Circuits Using Imperfect Duplication. FCT 1987: 279-283

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