"The Fault Tolerant CMOS Logical C-Element for Digital Devices Resistant to ..."

Yuri V. Katunin, Vladimir Ya. Stenin (2019)

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DOI: 10.1109/EWDTS.2019.8884458

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-12

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Yuri V. Katunin, Vladimir Ya. Stenin:
The Fault Tolerant CMOS Logical C-Element for Digital Devices Resistant to Single Nuclear Particles. EWDTS 2019: 1-4

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