"Multi-Run March Tests for Pattern Sensitive Faults in RAM."

Eugenia Buslowska, Vyacheslav N. Yarmolik (2018)

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DOI: 10.1109/EWDTS.2018.8524643

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-13

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Eugenia Buslowska, Vyacheslav N. Yarmolik:
Multi-Run March Tests for Pattern Sensitive Faults in RAM. EWDTS 2018: 1-6

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