"Architecture of built-in self-test and recovery memory chips."

V. A. Andrienko et al. (2013)

> Home

Details and statistics

DOI: 10.1109/EWDTS.2013.6673185

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/ewdts/AndrienkoDRU13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ewdts/AndrienkoDRU13
V. A. Andrienko, Moamar Diaa, V. G. Ryabtsev, Tetyana Utkina:
Architecture of built-in self-test and recovery memory chips. EWDTS 2013: 1-12

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.