"Analysis of Bridging Defects in Sequential CMOS Circuits and their Current ..."

Rosa Rodríguez-Montañés, Joan Figueras (1994)

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DOI: 10.1109/EDTC.1994.326852

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Rosa Rodríguez-Montañés, Joan Figueras:
Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability. EDAC-ETC-EUROASIC 1994: 356-360

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