"Test of Bridging Faults in Scan-based Sequential Circuits."

Eugeni Isern, Joan Figueras (1994)

> Home

Details and statistics

DOI: 10.1109/EDTC.1994.326850

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/eurodac/IsernF94
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/eurodac/IsernF94
Eugeni Isern, Joan Figueras:
Test of Bridging Faults in Scan-based Sequential Circuits. EDAC-ETC-EUROASIC 1994: 366-370

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.