"Accumulator-based test-per-clock scheme for low-power on-chip application ..."

Ioannis Voyiatzis (2014)

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DOI: 10.1109/ETS.2014.6847836

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Ioannis Voyiatzis:
Accumulator-based test-per-clock scheme for low-power on-chip application of test patterns. ETS 2014: 1-2

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