"Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study."

Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev (2011)

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DOI: 10.1109/ETS.2011.50

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev:
Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study. ETS 2011: 215

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