"Critical Path Selection for Delay Test Considering Coupling Noise."

Rajeshwary Tayade, Jacob A. Abraham (2008)

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DOI: 10.1109/ETS.2008.28

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Rajeshwary Tayade, Jacob A. Abraham:
Critical Path Selection for Delay Test Considering Coupling Noise. ETS 2008: 119-124

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