"Measuring defect tolerance within mixed-signal ICs."

Stephen Sunter, Alessandro Valerio, Riccardo Miglierina (2016)

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DOI: 10.1109/ETS.2016.7519320

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Stephen Sunter, Alessandro Valerio, Riccardo Miglierina:
Measuring defect tolerance within mixed-signal ICs. ETS 2016: 1-2

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