"On random pattern testability of cryptographic VLSI cores."

A. Schubert, Walter Anheier (1999)

> Home

Details and statistics

DOI: 10.1109/ETW.1999.803820

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ets/SchubertA99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/SchubertA99
A. Schubert, Walter Anheier:
On random pattern testability of cryptographic VLSI cores. ETW 1999: 15-20

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.