"An Integrated Built-In Test and Repair Approach for Memories with 2D ..."

Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich (2007)

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DOI: 10.1109/ETS.2007.10

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich:
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. ETS 2007: 91-96

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