"A Machine Learning-based Approach to Optimize Repair and Increase Yield of ..."

A. Manzini et al. (2019)

> Home

Details and statistics

DOI: 10.1109/ETS.2019.8791529

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ets/ManziniICCCCGMI19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/ManziniICCCCGMI19
A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, M. Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi:
A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. ETS 2019: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.