"Counterfeit Detection by Semiconductor Process Technology Inspection."

Matthias Ludwig et al. (2023)

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DOI: 10.1109/ETS56758.2023.10174131

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Matthias Ludwig, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl:
Counterfeit Detection by Semiconductor Process Technology Inspection. ETS 2023: 1-4

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