"Reliability analysis for power MOSFET based on multi-physics simulation."

Shuo Li, Hong Wang, Shiyuan Yang (2015)

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DOI: 10.1109/ETS.2015.7138731

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Shuo Li, Hong Wang, Shiyuan Yang:
Reliability analysis for power MOSFET based on multi-physics simulation. ETS 2015: 1-2

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