"Automating test program generation in STIL - expectations and experiences ..."

Helmut Lang, Bhuwnesh Pande, Heiko Ahrens (2003)

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DOI: 10.1109/ETW.2003.1231675

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Helmut Lang, Bhuwnesh Pande, Heiko Ahrens:
Automating test program generation in STIL - expectations and experiences using IEEE 1450 [standard test interface language]. ETW 2003: 99-104

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