"Improved DFT for Testing Power Switches."

S. Saqib Khursheed et al. (2011)

> Home

Details and statistics

DOI: 10.1109/ETS.2011.63

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-15

- view
  authority control:
- export record
  dblp key:
  - conf/ets/KhursheedYAHF11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/KhursheedYAHF11
S. Saqib Khursheed, Sheng Yang, Bashir M. Al-Hashimi, Xiaoyu Huang, David Flynn:
Improved DFT for Testing Power Switches. ETS 2011: 7-12

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.