"Acceleration of transition test generation for acyclic sequential circuits ..."

Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara (2005)

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DOI: 10.1109/ETS.2005.4

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara:
Acceleration of transition test generation for acyclic sequential circuits utilizing constrained combinational stuck-at test generation. ETS 2005: 48-53

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