"BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell."

Stefan Holst et al. (2023)

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DOI: 10.1109/ETS56758.2023.10174154

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu:
BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. ETS 2023: 1-6

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