"Combining the histogram method and the ultrafast segmented model ..."

Weida Chen et al. (2016)

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DOI: 10.1109/ETS.2016.7519298

access: closed

type: Conference or Workshop Paper

metadata version: 2018-03-15

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Weida Chen, Yongxin Zhu, Xinyi Liu, Xinyang Li, Dongyu Ou:
Combining the histogram method and the ultrafast segmented model identification of linearity errors algorithm for ADC linearity testing. ETS 2016: 1-2

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