"Combining symbolic and genetic techniques for efficient sequential circuit ..."

Marco Boschini et al. (2000)

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DOI: 10.1109/ETW.2000.873786

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Marco Boschini, Xiaoming Yu, Franco Fummi, Elizabeth M. Rudnick:
Combining symbolic and genetic techniques for efficient sequential circuit test generation. ETW 2000: 105-110

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