"An efficient scan tree design for test time reduction."

Yannick Bonhomme et al. (2004)

> Home

Details and statistics

DOI: 10.1109/ETSYM.2004.1347657

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/ets/BonhommeYFG04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/BonhommeYFG04
Yannick Bonhomme, Tomokazu Yoneda, Hideo Fujiwara, Patrick Girard:
An efficient scan tree design for test time reduction. ETS 2004: 174-179

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.