"Bandwidth Analysis for Reusing Functional Interconnect as Test Access ..."

Ardy van den Berg et al. (2008)

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DOI: 10.1109/ETS.2008.34

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  persistent URL:
  - https://dblp.org/rec/conf/ets/BergRMGG08
Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens:
Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism. ETS 2008: 21-26

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