"In situ measurement of aging-induced performance degradation in digital ..."

Nasim Pour Aryan et al. (2016)

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DOI: 10.1109/ETS.2016.7519285

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-24

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  dblp key:
  - conf/ets/AryanFBYSG16
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  - https://dblp.org/rec/conf/ets/AryanFBYSG16
Nasim Pour Aryan, Christian Funke, Jens Bargfrede, Cenk Yilmaz, Doris Schmitt-Landsiedel, Georg Georgakos:
In situ measurement of aging-induced performance degradation in digital circuits. ETS 2016: 1-2

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