"A unified fault model and test generation procedure for interconnect opens ..."

Gang Chen et al. (2005)

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DOI: 10.1109/ETS.2005.6

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker:
A unified fault model and test generation procedure for interconnect opens and bridges. ETS 2005: 22-27

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