"Utilizing Generative Adversarial Networks for Image Data Augmentation and ..."

Zhining Hu et al. (2024)

> Home

Details and statistics

DOI: 10.1109/ETFA61755.2024.10710793

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/etfa/HuSFSBK24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/etfa/HuSFSBK24
Zhining Hu, Tobias Schlosser, Michael Friedrich, André Luiz Buarque Vieira e Silva, Frederik Beuth, Danny Kowerko:
Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects. ETFA 2024: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.