"A new approach to the measurement of surface roughness using the pulse-jet ..."

V. Radhakrishnan et al. (1995)

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DOI: 10.1109/ETD.1995.403509

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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V. Radhakrishnan, N. Achutan, S. Verghese, R. Santoshkumar:
A new approach to the measurement of surface roughness using the pulse-jet capacitance method. Electronic Technology Directions 1995: 294-300

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