"On-chip I-V variability and random telegraph noise characterization in 28 ..."

Amy Whitcombe et al. (2016)

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DOI: 10.1109/ESSDERC.2016.7599632

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Amy Whitcombe, Scott Taylor, Martin Denham, Vladimir M. Milovanovic, Borivoje Nikolic:
On-chip I-V variability and random telegraph noise characterization in 28 nm CMOS. ESSDERC 2016: 248-251

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