"ESD characterisation of a-IGZO TFTs on Si and foil substrates."

Nian Wang et al. (2017)

> Home

Details and statistics

DOI: 10.1109/ESSDERC.2017.8066645

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/essderc/WangCHMSSBLG17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/WangCHMSSBLG17
Nian Wang, Shih-Hung Chen, Geert Hellings, Kris Myny, Soeren Steudel, Mirko Scholz, Roman Boschke, Dimitri Linten, Guido Groeseneken:
ESD characterisation of a-IGZO TFTs on Si and foil substrates. ESSDERC 2017: 276-279

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.