"Low-frequency noise assessment of the transport mechanisms in SiGe channel ..."

Tommaso Romeo et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343400

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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Tommaso Romeo, Luigi Pantisano, Eddy Simoen, Raymond Krom, Mitsuhiro Togo, N. Horiguchi, Jérôme Mitard, Aaron Thean, Guido Groeseneken, Cor Claeys, Felice Crupi:
Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs. ESSDERC 2012: 330-333

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