"Flicker noise in advanced CMOS technology: Effects of halo implant."

Navid Paydavosi et al. (2013)

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DOI: 10.1109/ESSDERC.2013.6818863

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-23

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Navid Paydavosi, Sriramkumar Venugopalan, Angada B. Sachid, Ali M. Niknejad, Chenming Hu, Sagnik Dey, Samuel Martin, Xin Zhang:
Flicker noise in advanced CMOS technology: Effects of halo implant. ESSDERC 2013: 238-241

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