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"Impact of Hot Carrier Degradation on the Performances of Current Mirrors ..."
C. Mukherjee et al. (2021)
- C. Mukherjee, Marine Couret, Cristell Maneux, Didier Céli:
Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology. ESSDERC 2021: 251-254
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