"In-depth electrical characterization of carrier transport in ambipolar ..."

Dae-Young Jeon et al. (2017)

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DOI: 10.1109/ESSDERC.2017.8066652

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Dae-Young Jeon, Tim Baldauf, So Jeong Park, Sebastian Pregl, Larysa Baraban, Gianaurelio Cuniberti, Thomas Mikolajick, Walter M. Weber:
In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETs. ESSDERC 2017: 304-307

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