"Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs."

Eleftherios G. Ioannidis et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948798

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-29

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Eleftherios G. Ioannidis, Sébastien Haendler, Christoforos G. Theodorou, Nicolas Planes, Charalabos A. Dimitriadis, Gérard Ghibaudo:
Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs. ESSDERC 2014: 214-217

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