"Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology."

Hung-Chi Han et al. (2022)

> Home

Details and statistics

DOI: 10.1109/ESSDERC55479.2022.9947192

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/essderc/HanJDZLKCE22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/HanJDZLKCE22
Hung-Chi Han, Farzan Jazaeri, Antonio A. D'Amico, Zhixing Zhao, Steffen Lehmann, Claudia Kretzschmar, Edoardo Charbon, Christian C. Enz:
Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology. ESSDERC 2022: 269-272

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.