"ACE: A robust variability and aging sensor for high-k/metal gate SoC."

Min Chen et al. (2013)

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DOI: 10.1109/ESSDERC.2013.6818849

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao:
ACE: A robust variability and aging sensor for high-k/metal gate SoC. ESSDERC 2013: 182-185

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