"Effect of Post Annealing on the Electrical Characteristics and Deep Level ..."

Dong-Wook Byun et al. (2022)

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DOI: 10.1109/ESSDERC55479.2022.9947098

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-07

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Dong-Wook Byun, Min-Yeong Kim, Soo-Young Moon, Myeongcheol Shin, Michael A. Schweitz, Sang-Mo Koo:
Effect of Post Annealing on the Electrical Characteristics and Deep Level Defects of Ga2O3/SiC Heterojunction Diodes. ESSDERC 2022: 249-252

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