"Glitch-induced within-die variations of dynamic energy in voltage-scaled ..."

Dina Kamel et al. (2010)

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DOI: 10.1109/ESSCIRC.2010.5619757

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Dina Kamel, Cédric Hocquet, François-Xavier Standaert, Denis Flandre, David Bol:
Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits. ESSCIRC 2010: 518-521

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