"Importance sampling Monte Carlo simulations for accurate estimation of ..."

T. S. Doorn et al. (2008)

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DOI: 10.1109/ESSCIRC.2008.4681834

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type: Conference or Workshop Paper

metadata version: 2023-03-21

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T. S. Doorn, E. Jan W. ter Maten, J. A. Croon, Alessandro Di Bucchianico, O. Wittich:
Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield. ESSCIRC 2008: 230-233

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