"Reliability assessment of voltage controlled oscillators in 32nm ..."

Florian Chouard, Michael Fulde, Doris Schmitt-Landsiedel (2010)

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DOI: 10.1109/ESSCIRC.2010.5619730

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-27

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Florian Chouard, Michael Fulde, Doris Schmitt-Landsiedel:
Reliability assessment of voltage controlled oscillators in 32nm high-κ metal gate technology. ESSCIRC 2010: 410-413

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