"Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen."

Peter Reiser, Heyno Garbe, Dietmar Giselbrecht (2006)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2006-08-22

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  dblp key:
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  - https://dblp.org/rec/conf/emv/ReiserGG06
Peter Reiser, Heyno Garbe, Dietmar Giselbrecht:
Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. EMV 2006: 245-252

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