"Translation of automotive module RF immunity test limits into equivalent ..."

Hugo Pues et al. (2013)

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DOI: 10.1109/EMCCOMPO.2013.6735209

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-12

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Hugo Pues, Ben Brike, Celina Gazda, Peter Teichmann, Kristof Stijnen, Christian Peeters, André Durier, Dries Vande Ginste:
Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models. EMC Compo 2013: 249-253

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