"Improvement of reproducibility of DPI method to quantify RF conducted ..."

Tohlu Matsushima et al. (2013)

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DOI: 10.1109/EMCCOMPO.2013.6735173

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Tohlu Matsushima, Nobuaki Ikehara, Takashi Hisakado, Osami Wada:
Improvement of reproducibility of DPI method to quantify RF conducted immunity of LDO regulator. EMC Compo 2013: 59-62

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